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Creators/Authors contains: "Zeledon, Cyrus"

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  1. ; ; ; ; ; ; ; ; ; ; et al (, Science Advances)
    Tomographic spectroscopy reveals how the properties of topological materials can be engineered at interfaces. 
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    Full Text Available 
  2. ; ; ; ; ; ; ; ; ; ; et al (, Physical Review B)
    null (Ed.)
    Full Text Available 
  3. ; ; ; ; ; ; ; ; ; (, APL Materials)
    We systematically investigate the role of defects, introduced by varying synthesis conditions and by carrying out ion irradiation treatments, on the structural and ferroelectric properties of commensurately strained bismuth ferrite BixFe2−xO3 layers grown on SrRuO3-coated DyScO3(110)o substrates using adsorption-controlled ozone molecular-beam epitaxy. Our findings highlight ion irradiation as an effective approach for reducing through-layer electrical leakage, a necessary condition for the development of reliable ferroelectrics-based electronics. 
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  4. ; ; ; ; ; ; ; ; ; ; et al (, Physical Review Materials)